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Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS

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China Phidix Motion Controls (Shanghai) Co., Ltd. certification
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Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS
Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS

Large Image :  Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS

Product Details:
Place of Origin: China
Brand Name: Phidix
Certification: IATF16949,CE
Model Number: M22001
Payment & Shipping Terms:
Minimum Order Quantity: Negotiable
Price: Negotiable
Packaging Details: 1 PC/Wooden Box
Delivery Time: 40 Work Days
Payment Terms: L/C, D/A, D/P, T/T, Western Union
Supply Ability: 10 PCS/Month

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS

Description
Color: White Customization: OEM, ODM
Packing: 1 PC/Carton Warranty: 1 Year
Lead-time: 40 Work Days Supply Ability: 10 PCS/Month
Resolution: 15nm, 20nm Magnification: 60,000X
Accelerating Voltage: 5kV To 30kV Signal Detection: (SEI)-Secondary Electron Image
Electron Gun: Filament Type, Pre Centered Tungsten Filament Cartridge Max Sample Size: 70mm In Diameter, 30mm In Height
Image Format: BMP, JPEG, PNG,TIFF Vacuum System: High Vacuum Mode
High Light:

15nm Resolution Scanning Electron Microscope

,

60000X Scanning Electron Microscope

,

20nm EDS electron microscope

 

Magnification Max 60,000X Scanning Electron Microscope 15nm Resolution with Optional EDS

 

As the basic desktop SEM, M22001 series can meet the basic experimental needs of most users. It is equipped with SE (secondary electron) detector and BSE (backscattered electron) detector. The load platform can be configured with three axes (X, Y, R). The manual platform can also be upgraded to a five-axis (X, Y, R, Z, T) automatic platform. The EDS spectrum analyzer can be configured in all series of products. The products include the following configurations:

 

Specials:

- Magnification Max 60,000X.

- Signal Detection: SE Detector+BSE Detector.

- Accelerating Voltage:5kV to 30KV, High image resolution.

- EDS is optional, for component analysis.

- High Vacuum System.

- Tilt Stage configuration (0~45°)( optional).

 

Item Specification M22001
Resolution 15nm (30kV, SE Image)
  20nm (30kV, BSE Image)
Magnification 30x~60,000x
Accelerating Voltage 5kV to 30kV (5kV/10kV/15kV/20kV/30kV-5 step)

Signal Detection

 

(SEI)-Secondary Electron Image
(BSEI)-Backscattered Electron Image
* Multi Detector (SEI+BSEI)
Observation mode Standard Mode
Charge-up reduction mode
Electron Gun Filament type, Pre Centered tungsten filament Cartridge
Bias voltage system, Automatic mode
Electron gun alignment, Manual mode
Lens system Focus Lens, 2-stage Electromagnetic Condenser Lens
Objective Lens, 1-stage Electromagnetic Objective Lens
Detector type, SE Detector/ BSE Detector
Stage system

Auto or Manual

Stage Traverse, 3 axis system, X, Y-axis : 35mm / R-axis: 360°

Image shift Image shift X, Y Image Shift (±150um)
Max sample size 70mm in diameter, 30mm in height
Image scanning system Fast Scan: 320x240 (Scan time: 0.1 sec.)
Slow Scan: 640x480 (Scan time: 3 sec.)
Photo Mode 1: 1280x960
Photo Mode 2: 2560x1920
Photo Mode 3: 5120x3840
Image format BMP, JPEG, PNG,TIFF
Data display Magnification, Detector type, Accelerating Voltage, Vacuum mode, Logo(Text), Date and time, Text marker, scale bar
Vacuum system

Fully Automatic Multi mode, High vacuum

Rotary Pump/100Liters/min

Turbo Molecular Pump/ 70Liters/sec

pump down time: less than 3 minutes

Control unit system

Mouse, Keyboard

PC

Software function

Image file open, edit, Save function

Length, area, angle measuring

parameter initialization, mage capture mode conversion), Archives, Setting(EDS)

Volume Main Unit-460(W)×600(D)× 950(H)mm……1set
External vacuum pump-400(W)×160(D)×340(H)mm …1set
Weight 99kg
Equipment environment

Temperature: 15℃~30℃
Humidity: 70% or less

Power source: Single phase 200~240V AC, 1KW, 50/60Hz

 

Accessories package:

 
Pre Centered tungsten filament 5 pcs/box

Sample Stage

 

 

15mm dia. (10 pcs)
25mm dia. (10 pcs)
15mm 45° Tilt (5 pcs)
15mm 90° Tilt (5pcs)
Height standard master 1ea
allen wrench 1set
SEM Software CD 1ea
Carbon conductive tape 1roll
scissors 1ea
tweezers 1ea
Tools Box 1ea

Note: ● means standard, ○ means optional

 

The sample test results

We conducted a practical test using a defective screw that was discarded in the laboratory as a sample. The pictures are as follows:

 

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 0

 

                                                         Screw, ×47, 30 kV, SE, High Vacuum

 

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 1

 

                                                            ×100, 10kV, SE, High Vacuum

 

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 2

 

                                                          ×100, 10kV, SE, High Vacuum

 

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 3

 

                                                           ×500, 10kV, SE, High Vacuum

 

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 4

 

                                                           ×500, 10kV, SE, High Vacuum

 

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 5

 

                                                          ×1000, 10kV, SE, High Vacuum

 

Other Pictures:

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 6

 

                            Ceramic ×5000                                                         Battery material ×10K

 

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 7

 

                       Phytoplankton ×8000                                                     Pearl powder ×1000

 

 

 

 

Magnification Max 60000X Scanning Electron Microscope 15nm Resolution Optional EDS 8

 

 

Contact Details
Phidix Motion Controls (Shanghai) Co., Ltd.

Contact Person: Johnny Zhang

Tel: 86-021-37214606

Send your inquiry directly to us (0 / 3000)