Home ProductsScanning Electron Microscope

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE

Certification
China Phidix Motion Controls (Shanghai) Co., Ltd. certification
China Phidix Motion Controls (Shanghai) Co., Ltd. certification
I'm Online Chat Now

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE
Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE

Large Image :  Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE

Product Details:
Place of Origin: China
Brand Name: Phidix
Certification: IATF16949,CE
Model Number: M22005
Payment & Shipping Terms:
Minimum Order Quantity: Negotiable
Price: Negotiable
Packaging Details: 1 PC/Wooden Box
Delivery Time: 40 Work Days
Payment Terms: L/C, D/A, D/P, T/T, Western Union
Supply Ability: 10 PCS/Month

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE

Description
Color: White Customization: OEM, ODM
Packing: 1 PC/Carton Warranty: 1 Year
Lead-time: 40 Work Days Supply Ability: 10 PCS/Month
Resolution: 1.5nm, 3nm Magnification: 800000X
Accelerating Voltage: 0~30kV Signal Detection: Ultra Vacuum Secondary Electron Detector (With Detector Perotection Function)
Electron Gun: Schotty Field Emission ELectron Gun Max Sample Size: 340mm In Diameter, 50mm In Height
Auto Function: Focus,Bright/Contrast,Stigmator,Alignment Etc Vacuum System: 2 Ion Pump,1TMP,1RP
High Light:

800000X Scanning Electron Microscope

,

1.5-3nm Resolution Scanning Electron Microscope

,

magnification electron microscope

 

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution with Optional BSE,EDS,EBSD and CL

 

M22005 electron microscope operating software can be switched in Chinese/English with modular layout. This software supports real-time simultaneous display of 5 images, 4 channels plus CCD window, and powerful auxiliary functions such as synthesis of secondary electron image and backscattered electron image, multi-point size measurement, text annotation of electron microscope image, vacuum map display, CCD window display, etc., to meet the individual needs of different users. Automatic functions: automatic filament, high voltage, focusing, brightness/contrast adjustment, astigmatism, electron beam centering, automatic correction of electron gun, fault detection, optional 3D reconstruction, etc. Saved pictures: 16384x16384pixel BMP, GIF, TIF, JPG, MNG, ICOCUR, TGA, PCX, JP2, JPC, PGX, RAS, PNM, SKA, SEM

 

Specials:

 

- Magnification Max 800000X.

- Signal Detection: Ultra Vacuum Secondary Electron Detector (With detector perotection function).

- Accelerating Voltage: 0~30KV, High image resolution.

- BSE/EDS/EBSD/CL is optional, for component analysis.

- High Vacuum System.

- Five Axes Encentric Motorized Stage.

 

Item Specification M22005
Resolution 1.5nm@15kV(SE), 3nm@30kV(BSE)
Magnification 8X~800000X, Displayed Magnification: Magnification is defined with a display size 127mm*211mm
Accelerating Voltage 0~30kV

Signal Detection

 

Ultra Vacuum Secondary Electron Detector (With detector perotection function)
Electron Gun Schotty Field Emission ELectron Gun
Auto Function Focus,Bright/Contrast,Stigmator,Alignment etc
StageSystem/Movement Standard Manual Stage
X: 0~80mm
Y: 0~60mm
Z: 0~50mm
R: 360°
T: -5°~90°
Max Sample Diameter: 175mm
Max Sample Height: 40mm
Optional Encentric Motorized Stage
X: 0~80mm                                             X: 0~150mm
Y: 0~50mm                                             Y: 0~150mm
Z: 0~30mm                                             Z: 0~60mm
R: 360°                                                   R: 360°
T: -5°~70°                                               T: -5°~70°
Max Sample Diameter: 175mm              Max Sample Diameter: 340mm
Max Sample Height: 20mm                    Max Sample Height: 50mm
Vacuum system 2 Ion Pump,1TMP,1RP
Optional Detector BSEEDSEBSDCL
Optional Accessories Pre-Vacuum Chamber/EBL/Cryo Stage/Nano Manipulator/Tensile Stage/ Control Panel/Track Ball

Note: ● means standard, ○ means optional

 

 

Gallery

 

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE 0

 

 

Image Processing Software

 

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE 1

 

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE 2

 

 

Magnification 8X-800000X Scanning Electron Microscope 1.5-3nm Resolution BSE 3

 

 

Contact Details
Phidix Motion Controls (Shanghai) Co., Ltd.

Contact Person: Johnny Zhang

Tel: 86-021-37214606

Send your inquiry directly to us (0 / 3000)