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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution
BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

Large Image :  BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

Product Details:
Place of Origin: China
Brand Name: Phidix
Certification: IATF16949,CE
Model Number: M22006
Payment & Shipping Terms:
Minimum Order Quantity: Negotiable
Price: Negotiable
Packaging Details: 1 PC/Wooden Box
Delivery Time: 40 Work Days
Payment Terms: L/C, D/A, D/P, T/T, Western Union
Supply Ability: 10 PCS/Month

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

Description
Color: White Customization: OEM, ODM
Packing: 1 PC/Carton Warranty: 1 Year
Lead-time: 40 Work Days Supply Ability: 10 PCS/Month
Resolution: 3nm Magnification: 300000X
Accelerating Voltage: 1~30kV Signal Detection: Secondary Electron Detector (SED)
Electron Gun: Pre-aligned Medium-sized Fork-type Tungsten Filament Max Sample Size: 370mm In Diameter, 68mm In Height
Auto Function: Auto Brightness Contrast, Auto Focus Vacuum System: Better Than 9 X 10-4 Pa Under High Vacuum
High Light:

BSE Scanning Electron Microscope

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3nm Resolution Scanning Electron Microscope

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EDS tabletop scanning electron microscope

 

Magnification 1X-300000X Scanning Electron Microscope 3nm Resolution with Optional BSE,EDS,EBSD,WDS and CL

 

M22006 is a cost-effective tungsten filament scanning electron microscope for the observation of nanoscale microstructures. It has a magnification of up to 300,000x and a resolution better than 3nm and is also equipped with a 370mm diameter sample chamber. It is a high-performance scanning electron microscope with ultra-high resolution and excellent image quality. The magnification is continuously adjustable, and clear images with high brightness can be obtained in different fields of view. The depth of field is large and the image is rich in stereo. Equipped with a large sample chamber and low voltage mode greatly expands the range of applications.

 

Specials:

 

- Magnification Max 300000X.

- Signal Detection: Secondary Electron Detector (SED).

- Accelerating Voltage: 1~30KV, High image resolution.

- BSE/EDS/EBSD/WDS/CL is optional, for component analysis.

- High Vacuum System.

- Three Axis Automatic (Standard).

 

Item Specification M22006
Resolution 3nm@30kV(SE)
Magnification 1X~300000X
Accelerating Voltage 1~30kV
Signal Detection Secondary Electron Detector (SED)
Electron Gun Pre-aligned medium-sized fork-type tungsten filament
Auto Function Auto Brightness Contrast, Auto Focus
StageSystem/Movement Control Method: Automatic Valve
Turbomolecular Pump:240 L/S
Mechanical Pump:12 m³/h(50 Hz)
Camera:Optical Navigation,Monitoring in the Sample Chamber
Sample Stage Configuration,Three Axis Automatic (Standard)
X: 0~100mm
Y: 0~100mm
Z: 0~60mm
Max Sample Diameter: 370mm
Max Sample Height: 68mm
Five Axis Automatic (Optional)
X: 0~115mm
Y: 0~115mm
Z: 0~65mm
R: 360°
T: -10°~75°
Max Sample Diameter: 370mm
Max Sample Height: 73mm
Vacuum System Better than 9 X 10-4 Pa under High Vacuum
Optional Detector BSEEDSEBSDWDSCL
Imaging System Image Pixel ≤ 6144 x 4096
Image Format: TIFF, JPG, BMP, PNG
Software Language: Chinese / English
Operating System: Windows
Navigation: Optical Navigation, Gesture Quick Navigation
Special Function: Dynamic Astigmatism
Installation Requirements Space: L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm
Door Size: W ≥ 900 mm, H ≥ 2000 mm
Temperature: 20 ℃ to 25 ℃
Humidity: ≤ 50%
Noise: ≤ 45dB
Power Supply: AC 220 V (±10 %), 50 Hz, 2 kVA
Ground Wire: Less than 4 Ω
AC Magnetic Field: Less than 100 nT

Note: ● means standard, ○ means optional

 

 

Gallery

 

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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution 1

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution 2

 

 

Applications

 

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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution 4

 

 

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution 5

 

 

 

Contact Details
Phidix Motion Controls (Shanghai) Co., Ltd.

Contact Person: Johnny Zhang

Tel: 86-021-37214606

Fax: 86-021-37214610

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