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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

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China Phidix Motion Controls (Shanghai) Co., Ltd. certification
China Phidix Motion Controls (Shanghai) Co., Ltd. certification
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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution
BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

Large Image :  BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

Product Details:
Place of Origin: China
Brand Name: Phidix
Certification: IATF16949,CE
Model Number: M22006
Payment & Shipping Terms:
Minimum Order Quantity: Negotiable
Price: Negotiable
Packaging Details: 1 PC/Wooden Box
Delivery Time: 40 Work Days
Payment Terms: L/C, D/A, D/P, T/T, Western Union
Supply Ability: 10 PCS/Month

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

Description
Color: White Customization: OEM, ODM
Packing: 1 PC/Carton Warranty: 1 Year
Lead-time: 40 Work Days Supply Ability: 10 PCS/Month
Resolution: 3nm Magnification: 300000X
Accelerating Voltage: 1~30kV Signal Detection: Secondary Electron Detector (SED)
Electron Gun: Pre-aligned Medium-sized Fork-type Tungsten Filament Max Sample Size: 370mm In Diameter, 68mm In Height
Auto Function: Auto Brightness Contrast, Auto Focus Vacuum System: Better Than 9 X 10-4 Pa Under High Vacuum
Highlight:

BSE Scanning Electron Microscope

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3nm Resolution Scanning Electron Microscope

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EDS tabletop scanning electron microscope

 

Magnification 1X-300000X Scanning Electron Microscope 3nm Resolution with Optional BSE,EDS,EBSD,WDS and CL

 

M22006 is a cost-effective tungsten filament scanning electron microscope for the observation of nanoscale microstructures. It has a magnification of up to 300,000x and a resolution better than 3nm and is also equipped with a 370mm diameter sample chamber. It is a high-performance scanning electron microscope with ultra-high resolution and excellent image quality. The magnification is continuously adjustable, and clear images with high brightness can be obtained in different fields of view. The depth of field is large and the image is rich in stereo. Equipped with a large sample chamber and low voltage mode greatly expands the range of applications.

 

Specials:

 

- Magnification Max 300000X.

- Signal Detection: Secondary Electron Detector (SED).

- Accelerating Voltage: 1~30KV, High image resolution.

- BSE/EDS/EBSD/WDS/CL is optional, for component analysis.

- High Vacuum System.

- Three Axis Automatic (Standard).

 

Item Specification M22006
Resolution 3nm@30kV(SE) ●
Magnification 1X~300000X ●
Accelerating Voltage 1~30kV ●
Signal Detection Secondary Electron Detector (SED) ●
Electron Gun Pre-aligned medium-sized fork-type tungsten filament ●
Auto Function Auto Brightness Contrast, Auto Focus ●
StageSystem/Movement Control Method: Automatic Valve ●
Turbomolecular Pump:240 L/S ●
Mechanical Pump:12 m³/h(50 Hz) ●
Camera:Optical Navigation,Monitoring in the Sample Chamber ●
Sample Stage Configuration,Three Axis Automatic (Standard) ●
X: 0~100mm ●
Y: 0~100mm ●
Z: 0~60mm ●
Max Sample Diameter: 370mm ●
Max Sample Height: 68mm ●
Five Axis Automatic (Optional) ○
X: 0~115mm ○
Y: 0~115mm ○
Z: 0~65mm ○
R: 360° ○
T: -10°~75° ○
Max Sample Diameter: 370mm ○
Max Sample Height: 73mm ○
Vacuum System Better than 9 X 10-4 Pa under High Vacuum ●
Optional Detector BSEEDSEBSDWDSCL ○
Imaging System Image Pixel ≤ 6144 x 4096 ●
Image Format: TIFF, JPG, BMP, PNG ●
Software Language: Chinese / English ●
Operating System: Windows ●
Navigation: Optical Navigation, Gesture Quick Navigation ●
Special Function: Dynamic Astigmatism ●
Installation Requirements Space: L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm ●
Door Size: W ≥ 900 mm, H ≥ 2000 mm ●
Temperature: 20 ℃ to 25 ℃ ●
Humidity: ≤ 50% ●
Noise: ≤ 45dB ●
Power Supply: AC 220 V (±10 %), 50 Hz, 2 kVA ●
Ground Wire: Less than 4 Ω ●
AC Magnetic Field: Less than 100 nT ●

Note: ● means standard, ○ means optional

 

 

Gallery

 

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

 

 

Applications

 

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

 

 

BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

 

 

 

Contact Details
Phidix Motion Controls (Shanghai) Co., Ltd.

Contact Person: Mr. Johnny Zhang

Tel: 86-021-37214606

Fax: 86-021-37214610

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